Largo Innova AB

Spectrophotometer
Within our software packages an amount of instruments from different suppliers may be used.
We have the possibilities to supply following together with the licenses:

		CM-3600a Horizontal bench top model with numerical gloss- and UV control, reflectance of opaque samples, transmittance of transparent liquids or solids, diffuse transmittance of translucent materials, sample viewing system. Size W 244 x H 208 x D 378 mm, Weight 11,5 kg Illumination/Observation system: Reflectance d8°, SCI/SCE , Reflectance range 0-200%, Transmittance d0°, Wavelength range 360-740 nm each 10 nm, 4 pulsed Xenon lamp, measurement time appr. 1,5 sec. Measurement area selectable LAV ø25,4/30, MAV 8/11, SAV 4/7 mm, Repeatability spectral reflectance standard deviation within 0,1%, colorimetric values standard deviation dEab 0,02. Inter-Instrument agreement dEab0,15 (SCI) BCRA specification cm-3600a.pdf
		CM-3610a Vertical model with numerical gloss- and UV control, viewfinder for easy sample observation. Ideal for non contact measurements such as powders, pigment, textile, paper and plaster measurements. Size W 300 x H 597 x D 315 mm, Weight 16,5 kg Illumination/Observation system: Reflectance d8°, SCI/SCE , Wavelength range 360-740 nm each 10 nm, 4 pulsed Xenon lamp, measurement time appr 3-4 sec. Measurement area selectable LAV ø25,4/30, MAV 8/11, SAV 4/7 mm, Repeatability spectral reflectance standard deviation within 0,1%, colorimetric values standard deviation dEab0,02. Inter-Instrument agreement dEab0,15 (SCI) BCRA specification cm-3610a.pdf
		Ci7 bench top reference instrument with reflection and transmission measurement capability on plastic, coated and liquid samples. Multiple areas of view (4), video preview and sample drop door, clear status panel display with dual remote read buttons for standard and sample measurements. Choice of horizontal or vertical measurement orientation. Size H 25 x W 23 x D 47cm. Repeatability (white tile) 0.01 RMS dE CIELab, Inter-Instrument agreement 0.08 Avg. dE CIELab, Illumination pulsed Xenon (D65 calibrated) with automated UV calibration and control. Optical configuration d/8° (intergrating sphere) Tri-beam grating. measurement time <1 sec, spectral range 360-750 nm, Wavelength interval 20 nm, Photometric range 0-200%. Photometric Resolution 0,001%. Interface USB / RS-232 specification ci7.pdf
		Ci5 flexible bench top instrument with reflection and transmission sample measurement capability, multiple areas of view (3), video preview and sample drop door. Clear status panel display with dual remote read buttons for standard and sample measurements. Size H 25 x W 23 x D 47 cm. Repeatability (white tile) 0.03 RMS dE CIELab, Inter-Instrument agreement 0.15 Avg. dE CIELab, Illumination pulsed Xenon (D65 calibrated). Optical configuration Tri-Beam d/8° (6 inch sphere 2-D CCD array) Holographic grating simultaneous SCE/SCI, automated UV control, automated lens position. measurement time <2,5 sec maximum reflection or transmission, spectral range 360-750 nm, Wavelength interval 20 nm, Photometric range 0-200% reflectance. Photometric Resolution 0,01%. Interface USB / RS-232. specification ci5.pdf
		CM-3220d Compact, lightweight, rugged and easy to use table top model with white calibration tile fixed to the instrument, flexible sample holder which can be locked at 90° for large specimen. Size 232 x 115 x 181 mm, Weight 4 kg. Illumination/viewing system d8°, simultaneous measurement of SCI/SCE, wavelength range 360-740 nm each 20 nm, 2 pulsed Xenon lamp, Measurement area ø 8 mm, Repeatability spectral reflectance standard deviation within 0,1%, Chromaticity Value standard deviation Mean ΔEab 0.4. Inter Instrument Agreement mean dEab 0,2 (based on 12 BCRA Series II colour tiles) specification cm-3220d.pdf
		CFS57 Ideal for high volume paint retailers. Compact, rugged and reliable with consistent, accurate readings of smooth or textured surfaces. Sphere based geometry, available in 45/0 or d/8°, with Built-in captive white calibration reference.Removable sample holder for measurement of unique samples. Measure aperture is 8 mm. Short-term repeatability 0.20 max ΔEab white ceramic (20 measurements) Inter instrument agreement. 0.3 Avg.E CIELAB, Illumination single Pulsed gas filled tungsten, no warm up. Measurement time <4 sec, spectral range 400-700 nm, Wavelength interval 20 nm, photometric range 0-200%. specification CFS57.pdf
		XTS Satellite ultra-compact spectrophotometer with simultaneous reflection SCE/SCI measurement capability designed for performance and affordability. Single 20 mm measurement aperture size. Traceable to NIST. Repeatability (white) .05 RMS DE CIELAB (typical), .20 RMSDE CIELAB (maximum) Inter instrument agreement .15Avg. DE CIELAB (typical) , .25 RMSDE CIELAB (maximum), Illumination single flash pulsed Xenon (D65), Optical configuration d/8° (integrating sphere) dual beam grating. Measurement time <2 sec, spectral range 360-750 nm, Wavelength interval 20 nm, Photometric range 0-120% / 0-200% (selectable). specification XTS.pdf
		CM-2600d/2500d/2300d Portable model with UV control (not CM-2500d or CM-2300d) and sample area view. AC adapter. Data memory 700 (SCI/SCE as a set). Size W 69 x H 96 x D 193 mm, Weight 670 g (without batteries). Illumination/viewing system d8, SCI/SCE, wavelength range 360-740 nm each 20 nm, 3 pulsed Xenon lamp, measurement time appr 1,5 sec. Measurement area selectable between MAV ø8/11 and SAV 3/6 mm (CM-2500d/CM-2300d only MAV). Repeatability spectral reflectance standard deviation within 0,1% (CM-2300d 0,2%), Chromaticity Value standard deviation DEab0,04 (CM-2300d 0,08). Inter instrument agreement DEab0,2 (MAV/SCI), CM-2300d 0,4 (SCI) BCRA specification CM-2600d.pdf CM-2500d.pdf CM-2300d.pdf
		CM-700d/600d A compact lightweight portable spectrophotometer with wireless/USB data communication and easy-to-read LCD screen display.Powwer supply 4x AA batteries: appr. 2,000 measurements or capacity: 4,000 set, Standard/Target colour difference: 1,000 set. Size 73 (W) x 212 (H) x 207 (D) mm, Weight appr. 550 g (without battery) Illumination/viewing system d8° SCI/SCE selactable, Wavelength range 400-700 nm each 20 nm, Pulsed xenon lamp (with UV-cut filter). Spectral reflection: Standard deviation within 0.1%, Chromaticity value: Standard deviation within ΔE ab 0.04. Inter-Instrument agreement within ΔEab 0.2 (MAV/SCI) Measurement area: CM-700d selectable MAV: Φ8 mm/ Φ11 mm, SAV: Φ3 mm/ Φ6 mm CM-600d MAV: Φ8 mm/ Φ11 mm specification CM-70d/600d.pdf
		RM61 Compact precise countertop spectrophotometer with built-in calibration reference. Measurement time in 2 seconds, illumination tungsten lamp, measurement area 8 mm, specification RM61.pdf
		SP62 handheld sphere spectrophotometer with large easy to read display with arrow keys. Memory 2024 standards and 2000 samples, measuring time 2 sek. Rechargeable battery pack last appr. 2000 measurements. Weight 1,1 kg. Repeatability (white) .05 RMS DE CIELAB (typical), .20 RMSDE CIELAB (maximum) Inter instrument agreement . (maximum), Illumination single flash pulsed Xenon (D65), Optical configuration d/8° (integrating sphere) dual beam grating. Measurement time <1sec, spectral range 360-750 nm, Wavelength interval 20 nm, Photometric range 0-120% / 0-200% (selectable). specification SP62.pdf
		XTH this compact portable instrument offers flexible measurements, especially on contoured and textured opaque parts, with simultaneous reflection SCE/SCI measurement capability designed for performance and affordability. Dual apertures (20mm and 5mm diameters) Traceable to NIST. Repeatability (white) .05 RMS DE CIELAB (typical), .20 RMSDE CIELAB (maximum) Inter instrument agreement. 15Avg. DE CIELAB (typical), .25 RMSDE CIELAB (maximum), Illumination single flash pulsed Xenon (D65), Optical configuration d/8° (integrating sphere) dual beam grating. Measurement time <2 sec, spectral range 360-750 nm, Wavelength interval 20 nm, Photometric range 0-120% / 0-200% (selectable). specification XTH..pdf